Manufacturing AUTOMATION

Integrated circuit test system

November 12, 2007
By Manufacturing AUTOMATION

ProductionLine Testers (PLT)
recently introduced a smaller integrated circuit (IC) test system that it says
is twice as fast as its previous fastest model. The PLT1000
is designed to test low-to medium complexity wafers or packaged ICs at
production-line rates of 1,000 tests per second. The new general purpose IC
test system is a PC-sized benchtop unit small enough to sit on top of or under
most device handlers and probers. The PLT1000
is programmed through an Excel-like spreadsheet where each row defines a test
and each column defines a test pin.

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