Nikon Metrology offers Mk 4 XT V X-ray inspection system

Dec. 13, 2016 – Nikon Metrology has released the Mk 4 XT V platform iteration which it says introduces “key improvements to enhance user experience and system reliability changes to increase uptime.”

XT V is a flat-panel based X-ray inspection system that aims to facilitate real-time imaging and defect analysis to the “highest level of detail.” According to Nikon, the real-time X-ray allows users to navigate “complex” printed circuit boards and electronic components to trace defects “even on the most challenging electronic components and assemblies,” adding that improvements include ergonomic revisions, safety and reliability enhancements. An isolated monitor arm and console has been added to the face-lift XT V, which allows for independent adjustment to help increase user comfort. As well, the Mk 4 boasts an improved profile with the PC integrated within the machine chassis, taking up less space on the shop floor.